SEM at UCSF
- A type of electron microscopy that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition and other properties such as electrical conductivity.
- Scanning electron microscopy
- Imaging assay → Microscopy → Electron microscopy → SEM
Biomaterials and Bioengineering Correlative Microscopy Core
Preventive and Restorative Dental Sciences,
Contact: Sunita Ho 415-514-2818
- Sigma 500-VP Field Emission Electron Microscope