Transmission electron microscopy at UCSF
- Definition
- An electron microscopy technique whereby a beam of electrons are transmitted through an ultra thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be detected by a sensor such as a CCD camera.
- Categories
- Imaging assay → Microscopy → Electron microscopy → Transmission electron microscopy
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Mission Bay
Gladstone Electron Microscopy Core
Gladstone Institutes,
Mission Bay
Contact: Jinny Wong
415-734-2570
jinny.wong@gladstone.ucsf.edu
- JEOL JEM-1230 Transmission electron microscope